<?xml version="1.0" encoding="utf-8" standalone="yes"?>
<rss version="2.0" xmlns:atom="http://www.w3.org/2005/Atom">
  <channel>
    <title>单元测试 on RuChen</title>
    <link>https://blog.195481.xyz/tags/%E5%8D%95%E5%85%83%E6%B5%8B%E8%AF%95/</link>
    <description>Recent content in 单元测试 on RuChen</description>
    <generator>Hugo -- gohugo.io</generator>
    <language>zh-cn</language>
    <managingEditor>2510889344@qq.com (RuChen)</managingEditor>
    <webMaster>2510889344@qq.com (RuChen)</webMaster>
    <copyright>All Rights Reserved © RuChen 2025</copyright>
    <lastBuildDate>Wed, 21 Oct 2026 17:44:39 +0800</lastBuildDate><atom:link href="https://blog.195481.xyz/tags/%E5%8D%95%E5%85%83%E6%B5%8B%E8%AF%95/index.xml" rel="self" type="application/rss+xml" />
    
    <item>
      <title>单元测试——隔离用例与可诊断回归</title>
      <link>https://blog.195481.xyz/embedded/embedded-study/l040-unit-test/</link>
      <pubDate>Wed, 21 Oct 2026 17:44:39 +0800</pubDate>
      <author>2510889344@qq.com (RuChen)</author>
      <guid>https://blog.195481.xyz/embedded/embedded-study/l040-unit-test/</guid>
      <description>能够把已学批次交接逻辑拆成彼此隔离、失败可定位的 C11 单元测试，用边界与错误用例建立可重复回归，并将测试证据与 STM32F407xx 时钟、外设、HAL 回调及实机证据严格区分。</description>
      
    </item>
    
  </channel>
</rss>
