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    <managingEditor>2510889344@qq.com (RuChen)</managingEditor>
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      <title>单元测试——隔离用例与可诊断回归</title>
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      <author>2510889344@qq.com (RuChen)</author>
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      <description>能够把已学批次交接逻辑拆成彼此隔离、失败可定位的 C11 单元测试，用边界与错误用例建立可重复回归，并将测试证据与 STM32F407xx 时钟、外设、HAL 回调及实机证据严格区分。</description>
      
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      <title>主机测试——受控事件验证嵌入式批次交接</title>
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      <pubDate>Wed, 21 Oct 2026 16:00:03 +0800</pubDate>
      <author>2510889344@qq.com (RuChen)</author>
      <guid>https://blog.195481.xyz/embedded/embedded-study/l039-host-test/</guid>
      <description>能够为已学的 STM32F407xx 采集到发送的批次交接划定可在主机运行的测试边界，用可控回调事件与故障序列、独立预期结果检验所有权、背压和恢复，同时将主机逻辑证据与 CubeMX/HAL/LL/寄存器参考实现及待执行的实机验证严格分开。</description>
      
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