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      <title>故障分析：把异常现场变成可证伪的证据链</title>
      <link>https://blog.195481.xyz/embedded/embedded-study/l035-fault-analysis/</link>
      <pubDate>Mon, 19 Oct 2026 19:13:26 +0800</pubDate>
      <author>2510889344@qq.com (RuChen)</author>
      <guid>https://blog.195481.xyz/embedded/embedded-study/l035-fault-analysis/</guid>
      <description>核心目标：规划一节故障分析课：用异常入口保存的状态寄存器、堆栈帧和故障指令地址建立可证伪的故障证据链，并在 STM32F407xx 上形成待目标工程验证的最小 HardFault 现场采集路径。新核心概念：异常入口的故障现场快照与有效性边界；从故障状态到可证伪根因假设的证据链。</description>
      
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