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    <title>Sample-and-Hold on RuChen</title>
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      <title>ADC 采样、量化与数字码交付的测量闭环</title>
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      <pubDate>Wed, 07 Oct 2026 17:56:34 +0800</pubDate>
      <author>2510889344@qq.com (RuChen)</author>
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      <description>用平台无关的 Host Fake 建立 ADC 单次转换闭环：输入在采样保持边界冻结，按参考范围和分辨率量化为有界数字码，经完成状态交付给调用方；通过事件日志、断言和故障注入验证逻辑，同时明确真实 STM32 电气、寄存器和 HAL 行为仍需按目标系列第一方资料核对。</description>
      
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